Efficient Test Sequence Generator for Area Optimization in LFSR Reseeding
نویسندگان
چکیده
منابع مشابه
Test vector encoding using partial LFSR reseeding
A new form of LFSR reseedingg that provides higher encodingg efficiency andd hence greater reductionn inn test dataa storage requirements is described. Previous forms of LFSR reseedingg have beenn static (i.e., test generationn is stoppedd andd the seedd is loadedd at one time) andd have requiredd full reseedingg (i.e., n=r bits are usedd for ann r-bit LFSR). The new form of LFSR reseedingg pro...
متن کاملA New Reseeding Technique for LFSR-Based Test Pattern Generation
In this paper we present a new reseeding technique for LFSR-based test pattern generation suitable for circuits with random-pattern resistant faults. Our technique eliminates the need of a ROM for storing the seeds since the LFSR jumps from a state to the required state (seed) by inverting the logic value of some of the bits of its next state. An eflcient algorithm for selecting reseeding point...
متن کاملEffective LFSR Reseeding Technique for Achieving Reduced Test Pattern
Aim of this study is to focus on reducing test pattern with effective Linear Feedback Shift Register (LFSR) reseeding. Test data volume of modern devices for testing increases rapidly corresponding to the size and complexity of the Systems-on-Chip (SoC). LFSR is a good pseudorandom pattern generator, which generates all possible test vectors with the help of the tap sequence. It can achieve hig...
متن کاملReducing Test Dat Volume Using LFSR Reseeding with Seed Compression
A new lossless test vector compressionn scheme is presentedd whichh combines linear feedback shift register (LFSR) reseedingg andd statistical codingg inn aa powerful way. Test vectors cann be encodedd as LFSR seeds by solvingg aa system of linear equations. The solutionn space of the linear equations cann be quite large. The proposedd methodd takes advantage of this large solutionn space too f...
متن کاملLFSR Reseeding Methodology for Low Power and Deterministic Pattern
An efficient low power built-in self-test methodology based on linear feedback shift register reseeding is proposed. This new method divides each test cube into several blocks and encodes that cube into a new test cube. In the new encoded test cube, the nontransitional blocks which no specified bits is included or only one kind of specified bit (1 or 0) is encoded into only one bit (1, 0, or X)...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Indian Journal of Science and Technology
سال: 2016
ISSN: 0974-5645,0974-6846
DOI: 10.17485/ijst/2016/v9i29/90874